Table 1.
Morphological parameters.
| Name | Description | Type | Centre | R500 |
|---|---|---|---|---|
| ns, 0 | Log gas density at a radius of 0.02R500 relative to a scaled critical density | M | V | Y |
| ns, 0* | Log gas density at a radius of 0.02R500 relative to a scaled critical density | M | P | Y |
| n50 | Log gas electron density at a radius of 50 kpc | M | V | N |
| n50* | Log gas electron density at a radius of 50 kpc | M | P | N |
| α | Inner density slope at 0.04R500 radius | M | V | Y |
| α* | Inner density slope at 0.04R500 radius | M | P | Y |
| α50 | Inner density slope at 50 kpc radius | M | V | N |
| α50* | Inner density slope at 50 kpc radius | M | P | N |
| c500 | Log ratio of integrated model surface brightness in apertures of 0.1R500 and R500 | M | V | Y |
| c500* | Log ratio of integrated model surface brightness in apertures of 0.1R500 and R500 | M | P | Y |
| c80 − 800 | Log ratio of integrated model surface brightness in apertures of 80 and 800 kpc | M | V | N |
| c80 − 800* | Log ratio of integrated model surface brightness in apertures of 80 and 800 kpc | M | P | N |
| F | Ratio of offset between best fitting cluster centre and peak and R500 | M/I | – | Y |
| P10, P20, P30, P40 | Log power ratio with orders from 1 to 4 | I | F | Y |
| P10*, P20* | Log power ratio with orders from 1 to 2 | I | P | Y |
| G | Gini coefficient (0–1) | I | F | Y |
| Aphot | Photon asymmetry | I | F | Y |
| Aphot* | Photon asymmetry | I | P | Y |
| w | Centroid shift | I | F | Y |
| ϵ | Ellipticity, the ratio of minor to major axis (0–1) | M | M | N |
| H | Slosh, the degree of sloshing factor (0–1) | M | M | N |
| M1, M2, M3, M4 | Multipole magnitudes (0–1) for orders 1 to 4 | M | M | N |
| Dshape | Combined disturbance score (0–1), based on ϵ, H, M1 to M4, and F | M/I | – | Y |
| Dcomb | Combined disturbance score (0–1), also including c80 − 800 | M/I | – | Y |
Notes. The Type column lists whether the parameter is the output of models (M) or computed from images (I). I values can also depend on the model fits (e.g. cluster centre, background rate, model surface brightness profile for masking). The type of cluster centre is given, including symmetric model position, where the value can vary during the analysis (V), when it is fixed to the best fit location (F), the cluster peak (P) or comes from the model being fitted, which can vary during the analysis (M). The column R500 specifies whether the parameter depends on the cluster radius. The disturbance indicators combine other parameters and are discussed in Sect. 8.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.