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Table 1

Main characteristics of the atomic lines used in the present analysis.

Elem Wavelength χex log gf R Remark
(nm) (eV)

Si I 594.855 8.50 1.23 20 000
Ca I 610.272 1.88 0.79 20 000
Ca I 612.221 1.89 0.32 20 000
Ca I 649.378 2.52 0.11 20 000
Ca I 671.768 2.71 0.52 20 000
Ni I 676.772 1.83 2.17 20 000
Sr II 407.771 0.00 +0.17 6000
Ba II 455.40 0.00 +0.17 6000 hfs(1)
Ba II 585.37 0.60 1.01 20 000 hfs(1)
Ba II 649.69 0.60 0.41 20 000 hfs(2)

Notes. R is the Resolving power of the spectrum used for the measurement. hfs(1): hyperfine structure from McWilliam et al. (1995). hfs(2): hyperfine structure from Mashonkina et al. (1999).

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