Analysis of repeated measurements for RED580 showing the standard deviation of parameters with S/N for a) T_eff; b) log g; c) V_rad; d) [M/H] and e) [α/Fe]. The histogram of number of spectra per number of repeats is shown in f). Individual stars are shown as red dots. The 70th percentile of the S/N bins are shown as black dots. The exponential fit to the black dots are shown as a blue line.