Table 2.
Results of the spectral analysis performed with XSPEC.
| Epoch | Instrument | χDoF2 | NH | kT | A | fX | FX |
|---|---|---|---|---|---|---|---|
| (1021 cm−2) | (keV) | (10−5 cm−5) | (erg cm−2 s−1) | (erg cm−2 s−1) | |||
| 2010-04-30 | XMM MOS(1+2) | 1.06 | 9.0 | 10.0 | (2.9 ± 1.0)×10−4 | (2.5 ± 0.9)×10−13 | (6.2 ± 2.1)×10−13 |
| 2023-12-28 | CXO ACIS-S | 1.44 | 30 ± 16 | 10.0 | (1.0 ± 0.8)×10−4 | (4.8 ± 3.5)×10−14 | (2.2 ± 1.6)×10−13 |
| 2024-01-05 | CXO ACIS-S | 1.85 | 8.9 ± 3.4 | 10.0 | (7.8 ± 2.6)×10−5 | (6.8 ± 2.2)×10−14 | (1.7 ± 0.5)×10−13 |
Notes. Observed (fX) and intrinsic (FX) fluxes computed in the 0.3–10.0 keV energy range. The normalization parameter (A) is defined as A = 10−14∫nHnedV/4πd2, where nH and ne are the hydrogen and electron densities; V is the volume of the X-ray-emitting region; and d is the distance. Boldface values represent fixed values during the spectral analysis.
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