Demonstration of the multi-epoch scoring based on the KHARMA SANE model with (a_*, R_low, R_high)=(−0.5, 10, 160). The 2017 and 2018 snapshot scoring results for the given model are shown in the M/D – PA plane with the blue and red distributions, respectively. The larger the overlap between the red and blue distributions, the better the fit of the multi-epoch observations with a single model. The black profile indicates the normalized combined distribution of the best-fit parameters computed according to the multi-epoch scoring procedure (see Sect. 4.4 for details). The dashed lines and shaded areas are the same as explained in Figs. 4 and 5.