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Table 1

Cleaning conditions applied to each of the training labels.

Label AV log Teff log ɡ [M/H] Mass
Training range [−0.2, 30] [3,5] [−1, 9] [−4, 0.6] [0.05, 70]
Maximum uncertainty 0.1 mag or 0.1 ⋅ AV σTeff<0.1Teff${\sigma _{{T_{{\rm{cff}}}}}} < 0.1 \cdot {T_{{\rm{eff}}}}$ 0.15 dex 0.1 dex (0.2 dex for [M/H]< −2) 0.2 ⋅ M
Excluded data WDs, hSDs VMP

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