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Fig. A.5

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Accuracy of the uncertainties of NEVeq and NEVb, for a range of different count rates, number of bins, and types of PSDs. This figure used the results of the same simulated light curves as are displayed in Fig. A.4. The parameter NEVm denotes a NIV estimate, which is either NEVb, or NEVeq. The parameter σm denotes the uncertainty in the measurement. The black dashed line at a value of 2/π$\sqrt {2/\pi } $, indicates the level that |NEVm – NIV| /σNEV,m = |Zm| should have. This figure excludes points from simulated light curves with very negative values of NEVeq for which the error cannot be determined. Other features are similar to those of Fig. A.4.

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