Simulation-based inference with neural posterior estimation applied to X-ray spectral fitting - Demonstration of working principles down to the Poisson regime

Open Access

Fig. 7

Illustration of single-round inference for X-ray spectral fitting. Top: Count spectrum corresponding to reference absorbed power-law spectrum (Spectrum₂₀₀₀₀counts), together with the folded best-fit model from both SBI-NPE (green solid line) and XSPEC (blue dashed line). Bottom: Residuals of the best fit from SBI-NPE.

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