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Fig. 2.

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Projected PSF-convolved SZ model map (top) and PSF convolved X-ray SB (middle) and temperature (bottom) maps. The contours for the models are overlaid to improve the visual representation of the maps. The simulated PSFs used for the SZ and X-ray maps correspond to 1.6′ and 10″ FWHM, respectively. To ensure accurate PSF convolution, we binned the pixels in the maps such that the FWHM of each instrument’s PSF is covered by at least three pixels.

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