Table 1.
Nonlinear model results.
| #Ref | Tmeas. | Thep. | N0a | Thicknessb | Nd | Depth d(ld)b |
|
|---|---|---|---|---|---|---|---|
| K | K | (1016 cm−2) | Å | (1016 cm−2) | Å/layers | (×103) | |
| 27W1 | 10 | 10 | 17.1 ± 0.3 | 540 ± 10 | 2.64 ± 0.96 | 84 ± 30 (27 ± 10) | 20 ± 2 |
| 27W2 | 10 | 100 | 1.8 ± 0.1 | 58 ± 3 | >0.23 | n.a. | >7.5 |
| 27W3 | 10 | 10 | 2.9 ± 0.1 | 92 ± 3 | >1.93 | n.a. | >16 |
| 29W1 | 10 | 100 | 60.1 ± 1 | 1924 ± 34 | n.a. | n.a. | 21 ± 2 |
| 30W2 | 10 | 10 | 59.7 ± 1 | 1880 ± 32 | 3.48 ± 0.37 | 111 ± 13 (35 ± 4) | 22 ± 1.2 |
Notes. Tmeas. and Tdep. are the ice temperature during measurement and deposition, respectively. N0 and thickness are the t = 0 initial ice column density and film thickness. Depth d(ld) is the sputtering depth (depth in number of ice monolayers) and Nd the corresponding ice column density. 
is the electronic sputtering yield for a semi-infinite ice film. Uncertainties given are statistical uncertainties calculated on the model fit.
From the fit and assuming an integrated absorption cross section of A = 2.2 × 10−16 cm molecule−1 (Leto & Baratta 2003; Mejía et al. 2015) for the amorphous compact ice.
The density considered for the ice thickness and number of molecular layers determination is 0.93 g cm−3 (Feistel & Wagner 2006).
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