Issue |
A&A
Volume 634, February 2020
|
|
---|---|---|
Article Number | A48 | |
Number of page(s) | 24 | |
Section | Numerical methods and codes | |
DOI | https://doi.org/10.1051/0004-6361/201936345 | |
Published online | 05 February 2020 |
MAXIMASK and MAXITRACK: Two new tools for identifying contaminants in astronomical images using convolutional neural networks
1
Laboratoire d’astrophysique de Bordeaux, Univ. Bordeaux, CNRS, B18N, allée Geoffrey Saint-Hilaire, 33615 Pessac, France
e-mail: maxime.paillassa@u-bordeaux.fr
2
Sorbonne Université, CNRS, UMR 7095, Institut d’Astrophysique de Paris, 98 bis bd Arago, 75014 Paris, France
Received:
18
July
2019
Accepted:
9
December
2019
In this work, we propose two convolutional neural network classifiers for detecting contaminants in astronomical images. Once trained, our classifiers are able to identify various contaminants, such as cosmic rays, hot and bad pixels, persistence effects, satellite or plane trails, residual fringe patterns, nebulous features, saturated pixels, diffraction spikes, and tracking errors in images. They encompass a broad range of ambient conditions, such as seeing, image sampling, detector type, optics, and stellar density. The first classifier, MAXIMASK, performs semantic segmentation and generates bad pixel maps for each contaminant, based on the probability that each pixel belongs to a given contaminant class. The second classifier, MAXITRACK, classifies entire images and mosaics, by computing the probability for the focal plane to be affected by tracking errors. We gathered training and testing data from real data originating from various modern charged-coupled devices and near-infrared cameras, that are augmented with image simulations. We quantified the performance of both classifiers and show that MAXIMASK achieves state-of-the-art performance for the identification of cosmic ray hits. Thanks to a built-in Bayesian update mechanism, both classifiers can be tuned to meet specific science goals in various observational contexts.
Key words: methods: data analysis / techniques: image processing / surveys
© M. Paillassa et al. 2020
Open Access article, published by EDP Sciences, under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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