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Fig. 1

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Recovery precision for Teff (top) and log g (bottom) from the SLAM module across the Kiel diagram. Test spectra are binned by ΔTeff = 1000 K and Δ log g = 0.5 dex (delineated by dashed grey lines). For each bin with a significant number of spectra, the four ‘traffic light’ bullets show the standard deviation of the label for S/Ns of (top to bottom) 30, 50, 100, and 250. Empty bins contain insufficient data for robust statistics.

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