Fig. 5.
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Morphological analysis of the large-scale surface brightness asymmetries in A795, see Sect. 3.2.1. Left panel: XMM-EPIC (0.5–2 keV) residual image Gaussian-smoothed with a kernel radius of 9 pixels. The four regions mark the sectors used to extract the surface brightness profiles shown in the right panel. The inner and outer radii of the annulus correspond to 190 kpc and 1 Mpc from the X-ray peak, respectively. The two cold fronts detected by Ubertosi et al. (2021) are marked in green. Right panel: XMM-EPIC (0.5–2 keV) surface brightness profile of the four sectors. The blue points represent the SE sector which shows the excess.
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