Fig. 2.
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Palomar Transient Factory (Maguire et al. 2014) SN Ia spectral measurements for velocity, width, and depth in the case of the Si IIλ6355 absorption feature. The power law fit to the velocity evolution and the Gaussian KDE (described by the contours) for the width and depth are used to inform the generation of the synthetic features in the simulations.
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