Probabilistic and progressive deblended far-infrared and sub-millimetre point source catalogues - I. Methodology and first application in the COSMOS field

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Volume 688 (August 2024)

A&A, 688 (2024) A20

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Table 4

Columns contained in our XID+ deblended far-IR and sub-mm point source catalogue.

Name	Unit	Description
ID	−	The COSMOS2020 ID (negative numbers for radio sources)
RA	−	Right Ascension from COSMOS2020 (or radio positions)
Dec	−	Declination from COSMOS2020 (or radio positions)

F_24	mJy	24 μm flux density (median)
FErr_24_u	mJy	24 μm flux density (84th Percentile); σ⁺ = FErr_24_u − FErr_24
FErr_24_l	mJy	24 μm flux density (16th Percentile); σ⁻ = FErr_24 − FErr_24_l
FErr_24_1σ	mJy	maximum of σ⁺ and σ⁻
Bkg_24	mJy/Beam	Fitted Background of 24 μm map (median)
Sig_conf_24	mJy/Beam	Fitted residual noise component due to confusion (median)
Sig_tot_24	mJy/Beam	total error = $\sqrt{({Sig_conf_24)}^{2} + (FErr_24_1 σ)^{2}}$ $\[\sqrt{(\text { Sig_conf_24) }^2+(\text { FErr_24_1} \sigma)^2}\]$
Rhat_24	−	Convergence Statistic (ideally < 1.2)
n_eff_24	−	Number of effective samples (ideally > 40)
Post_24	mJy	3000 samplings from the posterior PDF of the 24 μm flux density
tile_MIPS	−	tile number

F_100/160	mJy	100/160 μm flux density (median)
FErr_100/160_u	mJy	100/160 μm flux density (84th Percentile)
FErr_100/160_l	mJy	100/160 μm flux density (16th Percentile)
FErr_100/160_1σ	mJy	maximum of σ⁺ and σ⁻
Bkg_100/160	mJy/Beam	Fitted Background of 100/160 μm map (median)
Sig_conf_100/160	mJy/Beam	Fitted residual noise component due to confusion (median)
Sig_tot_100/160	mJy/Beam	total error = $\sqrt{(Sig_conf_100/160)^{2} + (FErr_100/160_1 σ)^{2}}$ $\[\sqrt{(\text { Sig_conf_100/160 })^2+(\text { FErr_100/160_1} \sigma)^2}\]$
Rhat_100/160	−	Convergence Statistic (ideally < 1.2)
n_eff_100/160	−	Number of effective samples (ideally > 40)
Post_100/160	mJy	3000 samplings from the posterior PDF of the 100/160 μm flux density
tile_PACS	−	tile number

F_250/350/500	mJy	250/350/500 μm flux density (median)
FErr_250/350/500_u	mJy	250/350/500 μm flux density (84th Percentile)
FErr_250/350/500_l	mJy	250/350/500 μm flux density (16th Percentile)
FErr_250/350/500_1σ	mJy	maximum of σ⁺ and σ⁻
Bkg_250/350/500	mJy/Beam	Fitted Background of 250/350/500 μm map (median)
Sig_conf_250/350/500	mJy/Beam	Fitted residual noise component due to confusion (median)
Sig_tot_250/350/500	mJy/Beam	total error = $\sqrt{(Sig_conf_250/350/500)^{2} + (FErr_250/350/500_1 σ)^{2}}$ $\[\sqrt{(\text { Sig_conf_250/350/500 })^2+(\text { FErr_250/350/500_1} \sigma)^2}\]$
Rhat_250/350/500	−	Convergence Statistic (ideally < 1.2)
n_eff_250/350/500	−	Number of effective samples (ideally > 40)
Post_250/350/500	mJy	3000 samplings from the posterior PDF of the 250/350/500 μm flux density
tile_SPIRE	−	tile number

F_850	mJy	850 μm flux density (median)
FErr_850_u	mJy	850 μm flux density (84th Percentile)
FErr_850_l	mJy	850 μm flux density (16th Percentile)
FErr_850_1σ	mJy	maximum of σ⁺ and σ⁻
Bkg_850	mJy/Beam	Fitted Background of 850 μm map (median)
Sig_conf_850	mJy/Beam	Fitted residual noise component due to confusion (median)
Sig_tot_850	mJy/Beam	total error = $\sqrt{({Sig_conf_850}^{2} + (FErr_850_1 σ)^{2}}$ $\[\sqrt{\left(\text {Sig_conf_850}^2+(\text { FErr_850_1}\sigma)^2\right.}\]$
Rhat_850	−	Convergence Statistic (ideally < 1.2)
n_eff_850	−	Number of effective samples (ideally > 40)
Post_850	mJy	3000 samplings from the posterior PDF of the 850 μm flux density
tile_SCUBA	−	tile number

Notes. σ⁺ can be calculated from the difference of the 84th percentile and the median. σ⁻ can be calculated from the difference between the median and the 16th percentile. The 1σ uncertainty of the source flux density can be derived from the maximum of σ⁺ and σ⁻. For a final estimate of the flux uncertainty, one can use the total error derived from combining the 1σ uncertainty and the residual confusion noise in quadrature. For the MIPS and SPIRE bands, this is equivalent to scaling the 1σ uncertainty by a factor of two. For the PACS and SCUBA-2 bands, the residual confusion noise is much smaller than the instrument noise level. Consequently, the total error is very close to the 1σ uncertainty.

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