Open Access
Table F.1.
ANN internal biases and uncertainties (from the mean absolute deviation) in the different S/N regimes considered for the ANN training.
| S/N | Teff | log(g) | [M/H] | [α/Fe] | |
|---|---|---|---|---|---|
| 50 | Bias | -19 K | -0.02 dex | 0.03 dex | -0.01 dex |
| MAD | 102 K | 0.16 dex | 0.13 dex | 0.06 dex | |
| 40 | Bias | 30 K | -0.07 dex | -0.01 dex | 0.02 dex |
| MAD | 149 K | 0.25 dex | 0.18 dex | 0.09 dex | |
| 35 | Bias | 39 K | -0.01 dex | 0.07 dex | 0.02 dex |
| MAD | 179 K | 0.31 dex | 0.21 dex | 0.11 dex | |
| 30 | Bias | -22 K | -0.01 dex | -0.05 dex | 0.01 dex |
| MAD | 233 K | 0.41 dex | 0.28 dex | 0.13 dex | |
| 25 | Bias | -2 K | -0.01 dex | 0.03 dex | 0.01 dex |
| MAD | 318 K | 0.56 dex | 0.38 dex | 0.16 dex |
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