Power spectrum S/N as defined in Eq. (14) and measured on the surface brightness fluctuation maps with the absolute method (see Sect. 2.6) in the four regions as defined in Table (1) and inside R₅₀₀ for each cluster in the X-COP sample. Dotted line and shaded envelopes show the posterior distribution median and 16th–84th percentiles, accounting for the complete error budget for each cluster. The plain line represents the measured observable for each cluster in X-COP. The plots are ranked in ascending order of disturbance for the cluster, as measured by the C_Z coefficient (see Sect. 4.1).