Fig. 6

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Beam pattern profiles for an instrument with 96 tiles, for zenith observations (four top plots) and low-elevation pointing (four bottom plots). Each group of four plots shows the stacking of 2D profile cuts of the beam pattern (cuts parallel to azimuth ϕ = 0° (left column) and ϕ = 90° (right column)). The envelope associated with the grating lobes of the tile limit the level of the instrument side-lobes array factor. Rotating the tiles helps lower these strong grating lobes envelope and smooth the SLL around a constant level that is likely independent of the pointing direction.
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