MAP values and estimated uncertainties for the smooth potential parameters η_ψ and a subset of the source parameters η_s. From left to right: Einstein radius, complex ellipticities of the SIE, external shear components, source effective radius, and Sérsic index. The dashed lines indicate the input values. The “smooth” models correspond to models without including pixelated perturbations; “pixelated” models correspond to our baseline models shown in Fig. 5; “high-res” (lens PS) is similar to the fiducial model but with a smaller ψ_pix pixel size; “refined” corresponds to models where the pixelated perturbations have been replaced with an analytical profile (see text for more details). For “pixelated” models we also show model parameters obtained with different regularization strengths with empty square symbols, above (low strength) and below (high strength) the fiducial model (see Fig. 6). For several parameters, error bars are smaller than the marker size.