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Table 4.
Properties of the high-z samples used in our analysis.
| Field | L2 − 10 keV | M* | SFR | SFRNORM | λsBHAR | Above MS | Inside MS | Below MS |
|---|---|---|---|---|---|---|---|---|
| log[erg s−1] | (1010 M⊙) | (M⊙ yr−1) | log | ∝λEdd | (%) | (%) | (%) | |
| CCLS | 44.32 ± 0.05 | 5.7 ± 1.0 | 203 ± 31 | 0.07 ± 0.13 | −0.87 ± 0.06 | 32.15 | 42.85 | 25.0 |
| XMM-XXL | 44.77 ± 0.05 | 4.2 ± 1.2 | 235 ± 79 | 0.19 ± 0.01 | −0.20 ± 0.10 | 35.89 | 61.54 | 2.56 |
| eFEDS | 45.20 ± 0.09 | 7.7 ± 2.5 | 552 ± 91 | 0.33 ± 0.06 | 0.10 ± 0.20 | 63.63 | 27.27 | 9.09 |
| Total | 44.75 ± 0.13 | 5.6 ± 0.8 | 236 ± 32 | 0.20 ± 0.02 | −0.47 ± 0.16 | 41.57 | 47.19 | 11.23 |
Notes. The median values of the properties in each sample are presented. The last three columns present the percentages of the high-z X-ray AGNs that are located inside, above and below the main sequence of the star-forming galaxies.
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