Table 3.
Physical properties of the plasma computed in the simulation volume compared to the ones measured through the end-to-end X-IFU simulation for a 1 Ms integration with spectral fitting.
| Field | Input (sim) | Output (X-IFU) |
|---|---|---|
| T (keV) | 5.52 | 5.33 ± [−0.31, 0.40] |
| v | 65 | 215 ± [−146, 123] |
| w | 465 | 384 ± [−148, 144] |
| A (1/Z⊙) | 0.20 | 0.25 ± [−0.05, 0.06] |
Notes. The reference (input) temperature is spectroscopic-like, v and w are the emission weighted averages, and A is the metal abundance, computed in the simulation volume as in Roncarelli et al. (2018).
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