Open Access

Fig. 7.


From top left to bottom right: maps in number of counts per X-IFU pixel (249 μm pitch) for cluster C2 (see Table 1) simulated with the end-to-end simulator SIXTE for redshift z ∼ 0.5 (top left), 1 (top right), 1.5 (bottom left) and 2 (bottom right), for an exposure time of 100 ks.

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