Left: reconstructed ICM parameters maps for C2 at z ∼ 0.1 using the multi-band fit presented in Sect. 4.6 with S/N ∼ 300 (∼90 000 counts per spatial bin). Middle: distribution within the regions j of (P_j − P_in, j)/σ_j indicating the goodness of the fit for each region in terms of σ_j (see Sect. 4.6). Right: relative error distribution across all spectral regions (green histogram). The red solid line pictures the Gaussian best fit. The vertical blue dashed lines are set at the mean value of the fit errors (see Sect. 4.6). From top to bottom: spectroscopic temperature T_sl (in keV), emission-measure-weighted abundances of oxygen (O), silicon (Si) and iron (Fe) (with respect to solar).