Corner plots of the relative error on parameter (Xfit − Xinp)/Xinp = ΔX/Xinp as function of parameter (Yfit − Yinp)/Yinp = ΔY/Yinp, for the spectroscopic temperature, Tsl, oxygen, silicon, and iron abundance, redshift, z, and the normalisation 𝒩, for cluster C4. The diagonal panels are the corresponding relative error distribution, where the red solid line indicates the Gaussian best fit of the distribution (parameters μΔP, σΔP given above) and the dotted line is the value of μΔP ± μfit. Top Broad-band fit. Bottom: multi-band fit (Sect. 4.6) considering a spectroscopic temperature.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.