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Table 8

Residuals of extracted argon emission lines comparing the measured line wavelength with the true wavelength.

Residual/nm Residual/pixel
Disperser SLIT MOS IFU SLIT MOS IFU

G140H −0.007 ± 0.015 −0.004 ± 0.020 0.017 ± 0.024 −0.031 ± 0.063 −0.019 ± 0.083 0.070 ± 0.099
G235H −0.024 ± 0.028 −0.019 ± 0.036 0.022 ± 0.036 −0.059 ± 0.069 −0.048 ± 0.090 0.055 ± 0.090
G395H −0.039 ± 0.040 −0.030 ± 0.060 0.000 ± 0.033 −0.058 ± 0.059 −0.044 ± 0.090 0.000 ± 0.040
G140M −0.006 ± 0.025 −0.013 ± 0.033 0.051 ± 0.019 −0.009 ± 0.039 −0.020 ± 0.053 0.080 ± 0.030
G235M −0.005 ± 0.047 −0.012 ± 0.054 0.076 ± 0.049 −0.005 ± 0.044 −0.011 ± 0.050 0.071 ± 0.046
G395M −0.006 ± 0.080 −0.034 ± 0.085 0.095 ± 0.064 −0.003 ± 0.045 −0.019 ± 0.048 0.053 ± 0.035

Notes. The data of each grating were averaged over multiple spectra and clipped with 4σ.

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