Table 3
Relative flux among soft-band instrumentsa.
| A | |||||||||
| ACIS-S3 | XIS0 | XIS1 | XIS3 | XRT | MOS1 | MOS2 | pn | ||
|
|
|||||||||
| ACIS-S3 | 0.00 | 7.49 ± 0.62 | 5.60 ± 0.60 | 6.88 ± 0.62 | 7.75 ± 0.86 | 10.26 ± 0.60 | 12.05 ± 0.61 | 17.76 ± 0.47 | |
| XIS0 | –7.49 ± 0.62 | 0.00 | –1.89 ± 0.74 | –0.60 ± 0.75 | 0.27 ± 0.96 | 2.78 ± 0.74 | 4.57 ± 0.75 | 10.28 ± 0.64 | |
| XIS1 | –5.60 ± 0.60 | 1.89 ± 0.74 | 0.00 | 1.28 ± 0.74 | 2.15 ± 0.95 | 4.66 ± 0.73 | 6.45 ± 0.73 | 12.16 ± 0.62 | |
| XIS3 | –6.88 ± 0.62 | 0.60 ± 0.75 | –1.28 ± 0.74 | 0.00 | 0.87 ± 0.96 | 3.38 ± 0.74 | 5.17 ± 0.74 | 10.88 ± 0.63 | |
| B | XRT | –7.75 ± 0.86 | –0.27 ± 0.96 | –2.15 ± 0.95 | –0.87 ± 0.96 | 0.00 | 2.51 ± 0.95 | 4.30 ± 0.96 | 10.01 ± 0.87 |
| MOS1 | –10.26 ± 0.60 | –2.78 ± 0.74 | –4.66 ± 0.73 | –3.38 ± 0.74 | –2.51 ± 0.95 | 0.00 | 1.79 ± 0.73 | 7.50 ± 0.62 | |
| MOS2 | –12.05 ± 0.61 | –4.57 ± 0.75 | –6.45 ± 0.73 | –5.17 ± 0.74 | –4.30 ± 0.96 | –1.79 ± 0.73 | 0.00 | 5.71 ± 0.63 | |
| pn | –17.76 ± 0.47 | –10.28 ± 0.64 | –12.16 ± 0.62 | –10.88 ± 0.63 | –10.01 ± 0.87 | –7.50 ± 0.62 | –5.71 ± 0.63 | 0.00 | |
Notes.
The logarithmic flux ratio 
between the soft-band
instruments A and B. The flux is measured in the 2.0–8.0 keV band. The range
indicates the convolved statistical uncertainty derived as
. Both the ratio and its
deviation are multiplied by 100 to save space. The uncertainties
and
are the mean of the
1σ statistical uncertainties in the upper and lower bound
directions (Table 2). The bold face
indicates that the difference is larger than 3 times the convolved statistical
uncertainty.
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