Issue |
A&A
Volume 642, October 2020
|
|
---|---|---|
Article Number | A185 | |
Number of page(s) | 6 | |
Section | Atomic, molecular, and nuclear data | |
DOI | https://doi.org/10.1051/0004-6361/202038266 | |
Published online | 20 October 2020 |
Electron-impact single ionization of Si+
Institute of Theoretical Physics and Astronomy, Vilnius University, Saulėtekio Av. 3, 10257 Vilnius, Lithuania
e-mail: valdas.jonauskas@tfai.vu.lt
Received:
25
April
2020
Accepted:
9
August
2020
Electron-impact single ionization is studied in the Si+ ion by considering transitions among energy levels. The study includes excitation-autoionization (EA) and collisional ionization processes. The excitations are investigated up to shells with the principal quantum numbers n ≤ 10. It is shown that correlation effects included in the EA calculations play a crucial role in explaining measurements. The correlation effects diminish the EA cross sections by ∼30% compared to single-configuration calculations. However, the collisional ionization is not significantly affected by an extension of the basis of interacting configurations. Good agreement between the presented level-to-level distorted wave data and experimental measurements is found for the single ionization of the Si+ ion.
Key words: atomic data / atomic processes
© ESO 2020
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