EDP Sciences
Free Access
Issue
A&A
Volume 534, October 2011
Article Number A20
Number of page(s) 7
Section Astronomical instrumentation
DOI https://doi.org/10.1051/0004-6361/201117660
Published online 22 September 2011
  • Abbey, A. F., Bennie, P. J., Turner, M. J. L., et al. 2003, Cooling out the radiation damage on the XMM-Newton EPIC MOS CCDs, NIM A513, 136
  • Burrows, D. N., Hill, J. E., Nousek, J. A., et al. 2005, Space Sci. Rev., 120, 165 [NASA ADS] [CrossRef]
  • Campana, S., Mangano, V., Blustin, A. J., et al. 2006, Nature, 442, 1008 [NASA ADS] [CrossRef] [PubMed]
  • Campana, S., Thöne, C. C., de Ugarte Postigo, A., et al. 2010, MNRAS, 402, 2429 [NASA ADS] [CrossRef]
  • Cucchiara, A., Levan, A. J., Fox, D. B., et al. 2011, ApJ, 736, 7 [NASA ADS] [CrossRef]
  • Falcone, A. D., Morris, D., Racusin, J., et al. 2007, ApJ, 671, 1921 [NASA ADS] [CrossRef]
  • Gehrels, N., Chincarini, G., Giommi, P., et al. 2004, ApJ, 611, 1005 [NASA ADS] [CrossRef]
  • Gehrels, N., Sarazin, C. L., O’Brien, P. T., et al. 2005, Nature, 437, 851 [NASA ADS] [CrossRef] [PubMed]
  • Godet, O., Beardmore, A. P., Abbey, A. F., et al. 2009, A&A, 494, 775 [NASA ADS] [CrossRef] [EDP Sciences]
  • Grupe, D., Leighly, K. M., & Komossa, S. 2008, AJ, 136, 2343 [NASA ADS] [CrossRef]
  • Holland, A. 1993, The Effect of Bulk Traps in Proton Irradiated EEV CCDs, NIM A326, 335
  • Hopkinson, G. R. 1996, Proton Effects in Charge-Coupled Devices, IEEE Trans. Nucl. Sci., 43, 614 [NASA ADS] [CrossRef]
  • Janesick, J., Elliott, T., & Pool, F. 1989, Radiation Damage in Scientific Charge-Coupled Devices, IEEE Trans. Nucl. Sci., 36, 572 [NASA ADS] [CrossRef]
  • Kennea, J. A., Burrows, D. N., Pagani, C., et al. 2007, Proc. SPIE, 6686
  • McLean, F. B., Boesch, H. E., & Oldham, T. R. 1989, Charge generation, transport and trapping, Ionizing Radiation Effects in MOS Devices and Circuits, ed. T. P. Ma, & P. Dressendorfer (John Wiley and Sons), Chap. 3
  • Moretti, A., Margutti, R., Pasotti, F., et al. 2008, A&A, 478, 409 [NASA ADS] [CrossRef] [EDP Sciences]
  • Osborne, J. P., Page, K. L., Beardmore, A. P., et al. 2011, ApJ, 727, 124 [NASA ADS] [CrossRef]
  • Osten, R. A., Godet, O., Drake, S., et al. 2010, ApJ, 721, 785 [NASA ADS] [CrossRef]
  • Page, K. L., Osborne, J. P., Evans, P. A., et al. 2010, MNRAS, 401, 121 [NASA ADS] [CrossRef]
  • Page, K. L., Starling, R. L. C., Fitzpatrick, G., et al. 2011, MNRAS, accepted
  • Plucinsky, P. P., Haberl, F., Dewey, D., et al. 2008, Proc. SPIE, 7011
  • Prigozhin, G. Y., Kissel, S. E., Bautz, M. W., et al. 2000, Proc. SPIE, 4140, 123 [NASA ADS] [CrossRef]
  • Prigozhin, G. Y., Bautz, M. W., Kissel, S. E., et al. 2004, Proc. SPIE, 5501, 357 [NASA ADS] [CrossRef]
  • Racusin, J., Karpov, S. V., Sokolowski, M., et al. 2008, Nature, 455, 183 [NASA ADS] [CrossRef] [PubMed]
  • Romano, P., La Parola, V., Vercellone, S., et al. 2011, MNRAS, 410, 1825 [NASA ADS]
  • Schady, P., Savaglio, S., Krühler, T., et al. 2011, A&A, 525, 113 [NASA ADS] [CrossRef] [EDP Sciences]
  • Short, A. D. 2000, Swift XRT: proton enviroment and CCD degradation, Swift project document: SWIFT-LUX-RE-001/1
  • Smith, R. K., Brickhouse, N. S., Liedahl, D. A., et al. 2001, ApJ, 556, L91 [NASA ADS] [CrossRef]
  • Starling, R. L. C., Wiersema, K., Levan, A. J., et al. 2011, MNRAS, 396, 935
  • Tanvir, N. R., Fox, D. B., Levan, A. J., et al. 2009, Nature, 461, 1254 [NASA ADS] [CrossRef] [PubMed]
  • Van Lindt, V. A. J. 1987, The Physics of Radiation Damage in Particle Detectors, NIM A253, 453
  • Willingale, R., Bleeker, J. A. M., van der Heyden, K. J., et al. 2002, A&A, 381, 1039 [NASA ADS] [CrossRef] [EDP Sciences]
  • Willingale, R., O’Brien, P. T., Cowley, S. W. H., et al. 2006, ApJ, 649, 541 [NASA ADS] [CrossRef]

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