Electron density (n_e) maps in units of cm⁻³ derived using the [SII] (top) and log U bottom) methods. The [SII] method is applied to the total [SII]λλ6717,6731 line profile, while the log U map sums the flux contributions from the secondary and tertiary components. Typical mean and median values, together with the standard deviation and the median absolute deviation, respectively, are shown in the insets.