Fig. 10.

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Correspondence between the assembly state indicators measured from the DM distribution (horizontal axes) and from the ICM distribution (vertical axes), at z = 0. Each panel corresponds to a different parameter. Within each panel, each dot corresponds to a cluster or group; the dashed, gray line is the identity relation (Xgas = XDM); and the dashed red line is a least-squares linear fit, whose slope (m) is given at the top of each panel. Also the Spearman and Kendall rank correlation magnitudes, and their p-values, are given there.
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