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Table 1.

Accuracy and fraction of outliers obtained for X-ray surveys at different X-ray depths.

Survey Flux limit Area Photometry Accuracy Fraction of outliers Method
Ref. erg/s/cm2 deg2 σNMAD η
Chandra-COSMOS 1.9 × 10−16 0.9 N/I/B, Uv-O-NIR-MIR 0.015 6% SED fitting
(Salvato et al. 2009)

XMM-COSMOS 1.17 × 10−15 2.13 N/I/B, Uv-O-NIR-MIR 0.015 6.3% SED fitting
Salvato11

CDFS 9.1 × 10−18 0.13 N/I/B, Uv-O-NIR-MIR 0.014 6.7% SED fitting
(Hsu et al. 2014; Luo et al. 2010)

Stripe 82X XMM archival 7 × 10−17 7.4 B, UV-O-NIR-MIR 0.06 13.2% SED fitting
(Ananna et al. 2017)

Stripe 82X (XMM archival) 7 × 10−17 7.4 B, UV-O-NIR-MIR 0.06 12.7% ML
(Brescia et al. 2019)

Stripe 82X (XMM archival) 1 × 10−14 7.4 B, UV-O-NIR-MIR 0.122 13.1% ML
(Brescia et al. 2019)

XMM-SERVS 1 × 10−14 4.5 B, Uv-O-NIR-MIR 0.04 9.2% SED fitting
(Ni et al. 2021)

XMM-SERVS 1.3 × 10−14 3.0 B, Uv-O-NIR-MIR 0.04 9.6% SED fitting
(Ni et al. 2021)

Notes. Modified version of the table presented in Ananna et al. (2017). The X-ray flux is measured in the 0.5–2 keV range (0.5–10 keV for XMM-SERVS). In addition, we report the area coverage, type of photometry available (narrow, intermediate, broadband photometry), and wavelength coverage (UV, Optical, NIR, MIR).

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