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Table 6
Fine structure EW.
| Line | EWr (Å) | EWr (Å) |
|---|---|---|
| Best Data | Epoch 2 | |
| Si II*λ1264.74Å | 0.65 ± 0.03 | 0.57 ± 0.10 |
| Si II*λ1309.28Å | 0.12 ± 0.04 | 0.08 ± 0.11 |
| C II*λ1335.71Å | 0.63 ± 0.03 | 0.54 ± 0.12 |
| Si II*λ1533.43Å | 0.22 ± 0.03 | 0.20 ± 0.12 |
| Si II*λ1817.45Å | 0.11 ± 0.03 | 0.09 ± 0.10 |
| Fe II*λ2332.02Å | 0.31 ± 0.06 | 0.18 ± 0.12 |
| Fe II*λ2365.55Å | 0.10 ± 0.07 | 0.08 ± 0.15 |
| Fe II*λ2389.36Å | 0.17 ± 0.06 | 0.18 ± 0.13 |
| Fe II*λ2396.35Å | 0.46 ± 0.05 | 0.28 ± 0.15 |
| Fe II*λ2399.98Å | 0.19 ± 0.05 | 0.18 ± 0.15 |
| Fe II*λ2407.39 Å | 0.21 ± 0.06 | 0.15 ± 0.15 |
Notes. Rest-frame equivalent width (EWr) of fine-structure lines for Best Data (average of RRM3, RRM4, and RRM5 observations) and Epoch 2. The errors were computed via the formula in Cayrel (1988).
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