Open Access
Table 1
Summary of the STAGGER models used in the spatial sampling tests.
| Name | Teff (K) | log g (dex) | [Fe/H] |
|---|---|---|---|
| t5777g44m00 | 5775 ± 12 | 4.4 | 0 |
| t5777g44m20 | 5775 ± 9 | 4.4 | −2 |
| t45g20m00 | 4490 ±10 | 2.0 | 0 |
| t45g20m20 | 4480±10 | 2.0 | −2 |
| t50g20m20 | 4990±10 | 2.0 | −2 |
| t45g50m00 | 4507 ± 6 | 5.0 | 0 |
| t45g50m20 | 4501 ± 1 | 5.0 | −2 |
| t65g40m00 | 6430± 15 | 4.0 | 0 |
| t65g40m20 | 6440±15 | 4.0 | −2 |
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