Comparison of the Hα+[N II] flux measurement between the simulated and the incident spectra for the type 1 (left) and type 2 (right) AGN samples. Sources with a spectroscopic redshift measured from the simulated spectra and flagged as ‘good’ (see Sect. 5 for details) are marked with blue symbols. The bottom panel in each plot shows the percentage luminosity difference defined as ΔF/F = (F_Hα, sim − F_Hα, inc)/F_Hα, inc. The one-to-one flux relation is shown with a red dashed line, which is set to zero in the bottom panel. The dot-dashed blue line in the bottom panel represents the 50th percentile of the ΔF/F distribution. Top row: Simulated data: best fit flux obtained from the integration of a single broad component used to model the Hα+[N II] complex. Incident: Best fit flux obtained from the summation of the individual components used to model the Hα+[N II] complex for incident spectra (i.e., broad and narrow component for the Hα, [N II]λλ6549, 6583). Bottom row: The best fit flux of the Hα+[N II] complex is obtained from the integration of a single broad component for both simulated and incident data.