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Table 7.

Best-fitting models to XM3.

M1 (SXCOM+HXPL+UXCL) (preferred) Soft comptonization Hard comptonization
χ2/d.o.f. = 704.26/650 = 1.084 Tseed = 20 eV* ΓHX = 1.90 ± 0.04
erg cm−2 s−1 Te = 0.1 keV* F1 − 10(a) = 7.11 erg cm−2 s−1
erg cm−2 s−1
erg cm−2 s−1 NSC(b) = 8.51
M1-alt (SXCOM+HXCOM+UXCL): Tseed = 20 eV*, Te = 100 keV*
χ2/d.o.f. = 703.65/650 = 1.083 τhot = 0.27 ± 0.03,
RelXill+HXPL+UXCL (unpreferred) Ionized reflection Hard X-ray power law
χ2/d.o.f. = 712.33/646 = 1.103 Emissivity index =
Spin a* > 0.89 Relxill norm. =
Inner radius < 2 RISCO
Incl. = deg
log(ξ, [erg cm s−1]) =
Refl. frac. =

Notes. An asterisk (*) denotes a fixed parameter.

(a)

Unobscured 1−10 keV observed-frame flux of the hard power-law component.

(b)

NHC and NSC denote, respectively, the normalizations of the hard and soft X-ray COMPTT components.

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