Similar to Fig. A.1 (top right), but for a validation cluster placed at z = 1 (still at a 100 ks X-IFU exposure). Because each resolution element in the X-IFU image ‘sees’ a smaller region (in units of R₅₀₀), the mixing effects appear less prominent than in the z = 2 case. The reconstructed and XSPEC-fitted temperature profiles are therefore closer to the input EM-weighted profile.