Fig. 4

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Measured transmittance of the reduced analog deposited on a MgF2 substrate (blue curve) compared to the simulated spectrum of the Swanepoel method (pink curve) and Tauc-Lorentz model (green curve). The fitted parameters of the Tauc-Lorentz model are: A = 1.92 eV, C = 0.32 eV, Eo = 3.86 eV, Eg = 1.31 eV, and ε∞ = 2.34. The Swanepoel method and Tauc–Lorentz model predict a film thickness of 1375 and 1351 nm respectively.
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