Fig. 1
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Haze analog: Thin film (ƒ) overlaying a substrate (s). Each medium (or layer) is characterized by its thickness (d) and complex refractive index (N). df ≪ ds in practice, the scale is changed for clarity. The measured reflection and transmission of the film-substrate sample, Rfs and Tfs, respectively, are affected by multiple reflections at the different interfaces.
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