Fig. 9
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Logarithmic ratio of the X element (O, Ne, Mg, Si, S) abundances with that of Si. The abundances are derived from a two-component fit employing one single temperature parallel shock model (VPSHOCK) and a recombination additive model (VRNEI). We do not show the plot for region C because the 0.7 keV component is absent when VRNEI is employed.
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