Temporal variability of idealized line profiles during the N58 simulation sequence, sampled at 19 instances of time. Left columns: differently strong Fe I lines at λ620 nm, χ = 3 eV; right columns: lines of similar strength, but with different lower excitation potentials, χ = 1 eV (black) and 5 eV (red). Top row: profiles at disk center μ = 1; bottom row: μ = 0.59. To limit cluttering, profiles are shown for only two (orthogonal) azimuth angles. The right frames show zoomed-in images of the line centers, with wavelength scales equal to those in Fig. 3; the tick marks on the vertical axes correspond to those for the full profiles.