Table C.1
Pure sublimation fluxes for various Euclid components.
| Common path | dz/dt (Tnominal) | dz/dt (Twarm) | dz/dt (Tdecont.) |
|---|---|---|---|
| M1 | −0.3 nm month−1 | −4.0 nm month−1 | −3.6 µm s−1 |
| M2 | −0.0 nm year−1 | −1.0 nm year−1 | −2498 µm s−1 |
| FoM1 | −4.0 nm month−1 | −27 nm month−1 | −3.6 µm s−1 |
| FoM2 | −2.7 nm month−1 | −13 nm month−1 | −4.1 µm s−1 |
| M3 | −2.7 nm month−1 | −39 nm month−1 | −3.6 µm s−1 |
| Dichroic | −2.7 nm month−1 | −13 nm month−1 | −4.1 µm s−1 |
| NISP path | |||
| Corrector lens | −55 nm month−1 | −79 nm month−1 | −2.8 µm s−1 |
| Filter / Grism | −156 nm month−1 | −157 nm month−1 | −0.56 µm s−1 |
| Camera lenses | −111 nm month−1 | −111 nm month−1 | −0.42µm s−1 |
| Detector | −0.0 nm year−1 | −0.0 nm year−1 | −0.23 µm s−1 |
| VIS path | |||
| FoM3 | −0.5 nm month−1 | −4.0 nm month−1 | −3.6 µm s−1 |
| Detector | −1.5 µm day−1 | −4.1 µm day−1 | −579 µm s−1 |
| Structural elements | |||
| Baffle global | −0.0 nm year−1 | −0.3 nm year−1 | −0.49 µm s−1 |
| PLM baseplate | −1.2 nm month−1 | −8.8 nm month−1 | −0.64 µm s−1 |
Notes. These sublimation fluxes are pure, that is they neglect simultaneous condensation. They were computed for the temperatures in Table 1 using Eqs. (6) and (8), and are expressed as a change of ice film thickness. Total effective rates (sublimation and condensation) are given in Table 2. The sublimation flux alone is visualised in Fig. 12.
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