Table 3.
Log of APM 08279+5255 past observations and reflection parameters.
| Name | ObsID | Date | MJD | Total exp. | f2 − 10 | Ref. | R |
|---|---|---|---|---|---|---|---|
| CXO1 | 1643 | 2000 Oct. 11 | 51828 | 9.1 |
 |
a | – |
| XMM1 | 0092800101 | 2001 Oct. 30 | 52212 | 16.5 |
 |
a | < 1.1 |
| CXO2 | 2979 | 2002 Feb. 24 | 52329 | 88.8 |
 |
b | < 0.7 |
| XMM2 | 0092800201 | 2002 Apr. 28 | 52392 | 102.3 |
 |
a, b | < 1.4 |
| XMM3 | 0502220201 | 2007 Oct. 06 | 54379 | 89.6 |
 |
b |
 |
| XMM4 | 0502220301 | 2007 Oct. 22 | 54395 | 90.5 |
 |
b | < 1.1 |
| CXO3 | 7684 | 2008 Jan. 14 | 54479 | 88.1 |
 |
b | < 0.9 |
Notes. Absorbed fluxes are estimated in the 2−10 keV observed-band from phenomenological models, and are given in units of 10−13 erg cm−2 s−1, with errors given at 68% confidence level. The absorbed flux of CXO1 and XMM1 is evaluated from reanalyzed data (see Sect. 4), while the other values are taken from the literature (references: a. H02, b. C09). The total exposure is given in units of ks. The reflection fraction is obtained using lit_xill model, i.e. a zphabs*zedge*xillver model for XMM1 and a zphabs*(xillver+zgauss+zgauss) model for the other data. Values for the absorber, the edge and the absorption lines are set to the best fit of H02 and C09. Errors and upper limits on the reflection fraction are given at the 90% confidence level.
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