Fig. 2.
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Process of extracting the pixels with strong emission in ARs. The left image taken from AIA 171 Å shows the location of a selected AR. The middle image is the constructed raster image of the same AR from Si IV 1394 Å. The blue box in the left image shows the FOV of the raster image. The right image is the mask, presenting the pixels to extract after the threshold has been applied.
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