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Fig. 7.


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Average Mc with SEM as error bars for the last-layer, every-layer, and scratch models. The Mc of the every-layer models are slightly higher than those of the scratch models. The last-layer models show higher Mc for small training sets, and vice versa for large training sets. We add a small offset on the x-axis to the scratch models in order to prevent its error bars from lying on top of the other error bars.

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