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Table A.2.
Meaning of the several parameters, variables, and indices used in this paper.
Variable | Definition |
---|---|
α | Index to describe the colour dependence of the flux loss |
β | Index to describe the along scan position dependence of the along scan flux loss |
γ | Index to describe the AC centring error dependence of the AC flux loss |
Δ | Total bandwidth in wavelength units |
Δx | Across scan centring error |
Δy | Along scan centring error |
Δθ | Shift to transform pseudo-wavelength scale to the independent variable to describe Hermite functions |
δ | Kronecker delta function |
Φ | N × 1 matrix with all transformed source basis functions to a given calibration unit |
φ | Source basis function |
![]() |
Source basis function transformed to a given calibration unit |
κ | Calibration Unit |
Λ | Line Spread Function |
λ | Wavelength |
λcuton | Cut-on wavelength of the Gaia passbands |
λcutoff | Cut-off wavelength of the Gaia passbands |
μ | Mean spectra scale |
ν | Index to describe the AC velocity dependence of the AC flux loss |
ω | Each of the parameters needed to describe the instrument |
Ω | Number of parameters needed to describe the instrument |
σ | Standard deviation |
θ | Independent variable of the Hermite functions |
Θ | Scaling parameter |
A | Kernel to transform flux from mean scale to a given calibration unit |
B | M × N matrix with all source coefficients for all internal calibrators |
C | Hermite coefficients matrix |
D | Relative dispersion with respect to nominal |
E | Functions to describe the dependence of A with pseudo-wavelength |
G | Gaia white light magnitude |
GBP | Integrated blue Photometer magnitude |
GRP | Integrated red Photometer magnitude |
H | M × 1 matrix with epoch spectra in a given calibration unit for all internal calibrators |
I | Instrument kernel function |
J | Maximum number of neighbours at each side of the pseudo-wavelength to be predicted |
K + 1 | Number of coefficients to describe the across dependence of the instrument |
L + 1 | Total number of B functions |
M | Number of internal calibration sources |
N + 1 | Total number of source basis functions |
Nα | Degree of the AL flux loss polynomial dependence with colour |
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Degree of the AC flux loss polynomial dependence with colour |
Nβ | Degree of the AL flux loss polynomial dependence with AL centring error |
Nγ | Degree of the AC flux loss polynomial dependence with AC centring error |
Nν | Degree of the AC flux loss polynomial dependence with AC velocity |
Nsrc | Number of sources |
P | Along scan flux loss |
Q | Across scan flux loss |
R | Response function |
S | Spectral Photon Distribution |
Teff | Effective temperature |
U | Number of pseudo-wavelengths sampling points |
VC | Rotated matrix of the Hermite coefficients matrix |
a | Allowed threshold for the standard deviation of r when truncating the source coefficients |
b | Source coefficients |
c | Coefficient to describe the dependence with pseudo-wavelength of the instrument |
d | Coefficient to describe the across scan dependence of the instrument |
h | Epoch spectrum |
i | Index for the pixel |
j | Index for the neighbour sample |
k | Index for the across scan dependence of the instrument |
l | Index for the B basis functions |
m | Index for the internal calibration source |
n | Index for the source basis function |
n′ | Number of leading source basis functions selected during the truncation procedure |
p | Coefficient to describe the along scan flux loss |
q | Coefficient to describe the across scan flux loss |
r | Normalised standard deviation of the source coefficients excluding basis functions |
s | Index for the source. |
t | Index for infinite number of neighbours |
u | Pseudo-wavelength |
vAC | Across scan velocity |
x | Across scan position |
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