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Table 4.

Spectral features detected in the Si region.

Line BB Ref. wavelength Det. wavelength Line flux Velocity
α (Å) (Å) (ph s−1 cm−2 × 10−5) (km s−1)
Si XIV Lyα 190 6.1817 (a) 6.184 ± 0.001 6.2 ± 0.6 (b) 100 ± 50
Si XIIIr 190 6.6483 6.6506 ± 0.0007 100 ± 30
Si XIIIi 190 6.7195 6.6887 ± 0.0007 (c) = v(Si XIII r)
Si XIIIf 190 6.7405 6.7427 ± 0.0007 (c) 3.1 ± 0.4 = v(Si XIII r)
Si XII 1.8 6.7197 6.722 ± 0.003 0.9 ± 0.3 110 ± 110
Si XI 5 6.7841 6.788 ± 0.004 170 ± 180
Si X 5 6.8558 6.862 ± 0.004 270 ± 180
Si IX 32 6.9279 6.930 ± 0.003 1.1 ± 0.3 80 ± 120
Si VIII 32 7.0008 7.006 ± 0.005 1.6 ± 0.3 220±210
Si VII 32 7.0577 0.5 ± 0.2
Si II-VI(d) 121 7.1172 7.115 ± 0.001 2.6 ± 0.4 −120 ± 40
Al XIII Lyα 9 7.1764 (e) 7.177 ± 0.003 0.6 ± 0.2

Notes. For each of them, we report the detection parameter α and the best-fit values (wavelength and line flux). Line widths were fixed to 0.003 Å if not stated otherwise. Doppler velocities of the Si lines were computed with respect to the reference wavelengths measured by Hell et al. (2016). Hell et al. (2016) report a systematic uncertainty of 0.13 eV for Si lines, corresponding to an error on the wavelength of 0.0005 Å.

(b)

This line results in a best line width of Å.

(c)

Distances between the r line and the i and f lines computed from Drake (1988).

(d)

The Mg Lyβ (7.1037 Å, Erickson 1977) might be blended with the Si II-VI line.

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