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Fig. 1.

image

Summary of the quantitative spectroscopic analysis strategy used to determine Teff and log g. Top and middle panels: line profiles of Hδ and some He I lines in the HIRES spectrum, respectively. Shown are the synthetic spectra associated with two FASTWIND models with a different (Teff, log g) pair: our best solution (14 000 K, 3.5 dex, solid) and the one proposed by Liu et al. (2019; 18 000 K, 3.4 dex, dashed). The Hδ lines and some He I lines show infilling from the disk emission. Bottom panels: predicted variation of the ratios Si IIλ6347/Si IIIλ4552 (left) and Si IIλ6347/Si IIIλ4567 (right) with Teff for three values of log g (Si abundance fixed to solar). The horizontal gray band indicates the empirical measurement and its associated uncertainty.

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