Topleft: surface brightness profiles for the eight sectors using the median method. The thick black line is obtained from the whole image analysis. The dotted and dashed vertical line marks the position R500 and R200, respectively. Top right: SZ pressure profiles for the eight sectors overplotted on top of the pressure profile for the whole cluster (black line). (Centre) Two-dimensional temperature (left) and abundance (right) profiles for the eight sectors analysed. Bottom left: reconstructed entropy profiles for all sectors using the backward method. Bottom right: gas fraction profiles recovered applying the backward technique. The thick black line is the result for the azimuthally averaged profile. The dotted and dashed vertical line marks the position R500 and R200, respectively.
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