Robustness of the best fit for the G₀ (top left), Y _VSG (top right), Y _PAH (bottom left), and Y _BG (bottom right). We use the best fit SEDs given by the method described in Sect. 3 and create new SEDs choosing random flux values in each band from a Gaussian distribution having the best fit flux as a mean value and the observational uncertainty as σ. The best fit parameters for the mock SEDs are then compared with those initially obtained. The dashed lines represents 1 + median(σ) of the original best fit parameters.