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Table 4

Detected silicon emission lines.

Ion Line Reference wavelength Bayesian v Line flux
[Å] Blocks αsig [km s-1] [ph s-1 cm-2 × 10-5]

High H-like Si xiv Lyα 6.18224 ± (3.0 × 10-5) a 3.3 −170 ± 80
hardness He-like Si xiii r 6.64795b no d = v Si xiv
He-like Si xiii f 6.74029b 3.3 = v Si xiv
N-like Si viii Kα 7.00076c no d −1450 ± 200 3.8 ± 1.7
O-like Si vii Kα 7.05787c no d = v Si viii 3.5 ± 1.8
Al- to Na-like Si iivi Kα 7.11722c 3.3 −680 ± 250

Low He-like Si xiii f 6.74029b 8.5 −90 ± 60 19 ± 3
hardness

Notes. .

(b)

Drake (1988); values obtained from the WebGuide version of AtomDB 3.0.2. (Foster et al. 2012) using the lab/observed wavelengths listed. AtomDB lists uncertainties of 0.002 Å for the Drake values, which are overestimated: Drake (1988) do not give estimates for the uncertainty of their calculations, but the measurements of Beiersdorfer et al. (1989) suggest an agreement between experiment and theory to better than 0.2 mÅ, that is, a factor 10 smaller than AtomDB.

(c)

1772.01 ± 0.09 eV (Si viii), 1756.68 ± 0.08 eV (Si vii) and 1742.03 ± 0.06 eV (Si vi), with additional 0.13 eV systematic uncertainty Hell et al. (2016)

(d)

We run line searches for α ≥ 1.5sig.

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