Free Access

Table 4

Detected silicon emission lines.

Ion Line Reference wavelength Bayesian v Line flux
[Å] Blocks αsig [km s-1] [ph s-1 cm-2 × 10-5]

High H-like Si xiv Lyα 6.18224 ± (3.0 × 10-5) a 3.3 −170 ± 80
hardness He-like Si xiii r 6.64795b no d = v Si xiv
He-like Si xiii f 6.74029b 3.3 = v Si xiv
N-like Si viii Kα 7.00076c no d −1450 ± 200 3.8 ± 1.7
O-like Si vii Kα 7.05787c no d = v Si viii 3.5 ± 1.8
Al- to Na-like Si iivi Kα 7.11722c 3.3 −680 ± 250

Low He-like Si xiii f 6.74029b 8.5 −90 ± 60 19 ± 3

Notes. .


Drake (1988); values obtained from the WebGuide version of AtomDB 3.0.2. (Foster et al. 2012) using the lab/observed wavelengths listed. AtomDB lists uncertainties of 0.002 Å for the Drake values, which are overestimated: Drake (1988) do not give estimates for the uncertainty of their calculations, but the measurements of Beiersdorfer et al. (1989) suggest an agreement between experiment and theory to better than 0.2 mÅ, that is, a factor 10 smaller than AtomDB.


1772.01 ± 0.09 eV (Si viii), 1756.68 ± 0.08 eV (Si vii) and 1742.03 ± 0.06 eV (Si vi), with additional 0.13 eV systematic uncertainty Hell et al. (2016)


We run line searches for α ≥ 1.5sig.

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.