Detected silicon emission lines.
|Ion||Line||Reference wavelength||Bayesian||v||Line flux|
|[Å]||Blocks αsig||[km s-1]||[ph s-1 cm-2 × 10-5]|
|High||H-like||Si xiv Lyα||6.18224 ± (3.0 × 10-5) a||≥3.3||−170 ± 80|
|hardness||He-like||Si xiii r||6.64795b||no d||= v Si xiv|
|He-like||Si xiii f||6.74029b||≥3.3||= v Si xiv|
|N-like||Si viii Kα||7.00076c||no d||−1450 ± 200||3.8 ± 1.7|
|O-like||Si vii Kα||7.05787c||no d||= v Si viii||3.5 ± 1.8|
|Al- to Na-like||Si ii–vi Kα||7.11722c||≥3.3||−680 ± 250|
|Low||He-like||Si xiii f||6.74029b||≥8.5||−90 ± 60||19 ± 3|
Drake (1988); values obtained from the WebGuide version of AtomDB 3.0.2. (Foster et al. 2012) using the lab/observed wavelengths listed. AtomDB lists uncertainties of 0.002 Å for the Drake values, which are overestimated: Drake (1988) do not give estimates for the uncertainty of their calculations, but the measurements of Beiersdorfer et al. (1989) suggest an agreement between experiment and theory to better than 0.2 mÅ, that is, a factor 10 smaller than AtomDB.
1772.01 ± 0.09 eV (Si viii), 1756.68 ± 0.08 eV (Si vii) and 1742.03 ± 0.06 eV (Si vi), with additional 0.13 eV systematic uncertainty Hell et al. (2016)
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